Nano-View is developing and producing the state of the art equipments that can measure and analyze the thickness, optical properties, composition ratio and the surface roughness of the semiconductor, conductor, dielectric and liquid thin films that are used in semiconductor devices , LCD displays and sollar cell.

Our current main products are the spectroscopic ellipsometers that can greatly reduce the measurement time and increase the accuracy as a result of our patented 'calibration and alignment free' method. High speed measurement is also possible by using a multichannel detector. We also reduced the size of the equipment greatly so that the foot print is minimal. The measurement and the analysis can be very easily done by simple and user-friendly software.